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Book chapter

Hardware-Software System for Automation of Characteristics Measurement of SOI CMOS VLSI Elements under Extreme High Temperature Conditions (up to 300°C)

P. 423-428.
Mamed R. Ismail-zade, Aleksandr Y. Romanov, Egor Y. Kuzin, Vladimir S. Danykin, Igor A. Chetverikov.

Hardware-software system designed for automated SOI  MOSFETs  characteristics  measurement,  processing  and  SPICE  model  parameter  extraction  taking  into  account  high temperature (HT) effects (to 300°C) is presented. The essence of the system is comprised of a set of selected measurement instru-ments, measurement and data processing methods with the pur-pose  of  SPICE  model  library  creation  in  lightly  manned  condi-tions.  This  capability  to  program  measurement  conditions  and data  collection,  processing  and  saving  is  realized  with  in-house LabVIEW virtual instruments.