An EKV-RAD macromodel for SOI/SOS MOSFET with account for radiation effects is developed using a subcircuit approach. As an addition to the standard version of the EKV model 1) radiation dependencies of parameters VTO, GAMMA, KP, E0 are introduced and 2) additional circuit elements to account for floating-body effects and radiation-induced leakage currents under static and dynamic radiation influence are connected. Maximum simulation error is 5–7% in the dose range up to 1 Mrad. It is shown that EKV-RAD spends less CPU time by 15–30% for analog and 40–50% for digital SOI/SOS CMOS circuits simulations compared to BSIMSOI-RAD model.
The main content of the training manual is:consideration of the issues of the effect of radiation creating structural defects on the main parameters of bipolar transistors, Consider issues related to the influence of ionization factors on the operation of transistors (radiation transients), the effect of nuclear reactions and fast annealing on the parameters of transistors is considered; Classification of radiation effects in bipolar transistors is given.
A compact BSIMSOI-RAD macromodel for SOI/SOS CMOS transistors is developed that takes into account the radiation effects. An automated procedure for determination of macromodel parameters is described and shown to be useful for analyzing radiation hardness of CMOS IC fragments depending on the total absorbed dose. The simulation time is estimated.
The collection contains papers presented at the 10 th International Conference "Interaction of radiation with solids" (24-27 September 2013, Minsk) and covers the following topics: processes of interaction of radiation with solids, radiation effects in solids, the interaction of the plasma with the surface modification of materials properties, structure and properties of coatings, Equipment for radiation technologies. Addressed to researchers and students of natural faculties.
The collection contains papers presented at the 11 th International Conference "Interaction of radiation with solids" (23-25 September 2015, Minsk) and covers the following topics: processes of interaction of radiation with solids, radiation effects in solids, beam techniques the formation of nanomaterials and nanostructures, the modification of the properties of materials, structure and properties of coatings, Equipment for radiation technologies.
Addressed to researchers and students of natural faculties.