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October 8, 2026
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The 23rd Annual Meeting of the Valdai Discussion Club was held from September 28 to October 1, 2026 under the theme ‘Responsibility for the Future: Limits of the Possible, or Limitless Possibilities?’ The forum brought together 120 experts from 40 countries, including representatives of China, the United States, India, Brazil, the United Kingdom, Germany, Egypt, Iran, and Japan.
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The International N5 Symposium ‘Neural Networks and Nonlinearity in Nizhny Novgorod’ was held at the Nizhny Novgorod House of Scientists from September 23 to 26. The event was organised by HSE University–Nizhny Novgorod and the Nizhny Novgorod House of Scientists, with the participation of Sberbank and the Institute of Physics Belgrade. The symposium was held for the second time: the first conference took place in 2025 and attracted considerable interest from the academic community.

 

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Generalized Test Automation Method for MOSFET’s Including Characteristics Measurements and Model Parameters Extraction for Aero-Space Applications

P. 504–511.
Petrosyants K. O., Sambursky L. M., Kharitonov I. A., Ismail-zade M. R.

In this work features of measurement, processing and analysis of electrical characteristics of MOSFET’s subjected to various kinds of static irradiation (neutron, electron, and 􀈖-rays) and temperature in the extended high/low ranges are analyzed. As a result a unified (with account for radiation and temperature) automated measurement, parameters extraction and modeling system is developed, which presents a unified environment for a user. Examples are given of the system usage for estimation of integrated and discrete power MOSFET radiation/temperature hardness and their SPICE model parameters extraction.

Language: English
Full text
DOI
Keywords: model parameter extractionрадиационные эффектыавтоматизация измеренийradiation effectsМОП-транзисторыкомпактные SPICE-моделиэкстракция параметров SPICE-моделейautomation of measurementsMOSFET'stemperature effectsspice-modelingтемпературные эффекты

In book

Proceedings of XV IEEE East-West Design & Test Symposium (EWDTS'2017)
Piscataway: IEEE, 2017.
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