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September 25, 2026
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Моделирование радиационно-стимулированного тиристорного эффекта в инверторе, выполненном по КМОП-технологии

С. 97–98.
Petrosyants K. O., Kharitonov I. A., Sambursky L. M., Popov D., Ikhsanov R.
Language: Russian
Full text
Keywords: радиационная стойкостьradiation hardnessМОП-транзисторMOSFET
Publication based on the results of:
Моделирование воздействия тепловых и радиационных эффектов на микроэлектронные компоненты (2015)

In book

19-ая Всероссийская научно-техническая конференция «Радиационная стойкость электронных систем» «СТОЙКОСТЬ-2016»
ФГУП "НИИП", 2016.
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Added: October 30, 2018
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