Рентгеновская оптика - 2010: Материалы совещания, г.Черноголовка, 20-23 сентября 2010 г.
The texts of papers presented at the workshop on "X-Ray Optics - 2010" are published. Topics of the meeting included the following topics: X-ray crystal optics, multilayer optics for X-ray and extreme ultraviolet, X-ray technology of optical elements, the use of X-ray optics for the study of micro-and nanostructures, X-ray lithography, X-ray microscopy and imaging, new methods of micro-and nanostructures studies using synchrotron and laboratory X-ray sources.
Method of in-situ X-ray reflectivity is presented. The results of investigation of titanium and silicon thin films in real-time of their deposition on silicon substrates are discussed.