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SiGe HBT Performance Modeling after Proton Radiation Exposure
P. 274–277.
The effects of proton irradiation on SiGe heterojunction bipolar transistor (HBT) are investigated using Synopsys/ISE TCAD tool. To account for the impact of proton irradiation models for carrier lifetime degradation under irradiation are included in the program. The results of modeling the impact of protons of different energies are presented. For SiGe HBT increase in the base current for low-energy protons is more intense than for high-energy protons. We also present the simulation results of SiGe HBT dc and ac performance after proton exposure. The simulation results are in good agreement with experimental data.
In book
Kharkov: Kharkov national university of radioelectronics, 2012.
Emir S. Amirov, Liu D., Samatov M. et al., The Journal of Physical Chemistry Letters 2025 Vol. 16 No. 51 P. 13075–13082
Cs2AgBiBr6 is a promising lead-free double perovskite with excellent stability, but it suffers from a large bandgap for optoelectronic applications. Hydrogenation is reported not only to reduce the bandgap but also to prolong the carrier lifetime in Cs2AgBiBr6, improving device efficiencies significantly. In order to elucidate the mechanisms underlying these phenomena, we combine density functional theory ...
Added: December 20, 2025
Nadtochiy A., Мельниченко И. А., Ivanov K. et al., Физика и техника полупроводников 2022 Т. 56 № 10 С. 993–996
Методами спектроскопии фотолюминесценции в непрерывном режиме и с разрешением по времени исследована гетероструктура с квантовыми яма-точками InGaAs/GaAs в диапазоне температур 10-300 K. Полученное время спада ФЛ разделено на излучательную и безызлучательную составляющие времени жизни носителей заряда. Обнаружено, что излучательное время жизни демонстрирует экспоненциальный рост с увеличением температуры, в то время как температурная зависимость безызлучательного времени ...
Added: January 4, 2023
Petrosyants K. O., Ismail-zade M. R., Kozhukhov M. et al., Наноиндустрия 2022 Т. 15 № S8-1(113) С. 183–194
The paper highlights RAD-THERM-AGING versions of TCAD and SPICE models developed for BiCMOS VLSI components with submicron and nanometer sizes, taking into account various types of radiation effects, temperatures in the wide range of -260...+300°C and aging during long-term operation. ...
Added: July 7, 2022
Petrosyants K. O., В кн.: Математическое моделирование в материаловедении электронных компонентов МММЭК–2021.: М.: МАКС Пресс, 2021. С. 112–116.
Added: November 30, 2021
Лыткарино МО: АО "НИИП", 2020.
History
Published since 1990
Subject
External radiation operating conditions of products of electronics and radio-electronic equipment
Radiation and electromagnetic effects in radioelectronics, parameters degradation, failures, single failures
Assessment and support of radiation resistance and reliability of products of electronics, radio-electronic equipment, radio engineering materials, including materials of space assignment
Calculation methods of determination of radiation resistance of products
Test installations and accelerators, ...
Added: July 14, 2021
Sadovnichii D. N., A.P. Tyutnev, Milekhin Y. M., Russian Chemical Bulletin 2020 No. 9 P. 1607–1613
The modern state of experimental and theoretical studies of the radiation-induced conductivity and charging of polymeric dielectrics under the action of electron beams is considered. The eff ect of the molecular mobility on the transport of excess charge carriers is discussed. ...
Added: December 19, 2020
Садовничий Д. Н., А.П. Тютнев, Мелехин Ю. М., Известия Академии наук. Серия химическая 2020 № 9 С. 1607–1613
В обзоре рассмотрено современное состояние вопросов экспериментального и теоретического изучения радиационно-индуцированной электропроводности и электризации полимерных диэлектриков при воздействии пучков электронов. Обсуждается влияние молекулярной подвижности на транспорт избыточных носителей заряда в полимерных материалах. ...
Added: December 15, 2020
Petrosyants K. O., Kozhukhov M., В кн.: Международный форум «Микроэлектроника-2020». Школа молодых ученых. Сборник тезисов. Республика Крым, г. Ялта, 21-25 сентября 2020 г.: М.: МАКС Пресс, 2020. С. 394–397.
The unified Si BT/SiGe HBT SPICE-model is presented, which allows performing SPICE simulation of integrated circuits that considering the radiation effect. The results of measurements and modeling of electrical characteristics of bipolar transistors before and after exposure to various radiation types are presented. ...
Added: December 5, 2020
Petrosyants K. O., Kozhukhov M., Popov D., Наноиндустрия 2018 № 82 С. 404–405
The paper considers a new TCAD Rad model for BJTs and MOSFETs for proton radiation. The equations for radiation-dependent parameters (life time, mobility, surface velocity, traps concentration) have been added in Sentaurus TCAD. The simulation results are in good agreement with experimental data. ...
Added: January 30, 2019
Petrosyants K. O., Наноиндустрия 2018 № 82 С. 42–45
The article highlights the status of TCAD and SPICE modeling of CMOS, SOI CMOS, SiGe BiCMOS VLSI components intended for operation under the influence of radiation (neutrons, electrons, protons, y- and X-ray, single particle, pulsed radiation), high (up to +300°C) and low (up to –200°C) temperatures. TCAD and SPICE models of BJTs and MOSFETs, and ...
Added: January 30, 2019
Kharitonov I. A., В кн.: XVII Всероссийская научно-техническая конференция «Электроника, микро- и наноэлектроника»: 14 - 18 мая 2018 года, г. Суздаль, Россия.: М.: НИИСИ РАН, 2018. С. 82–83.
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Added: November 7, 2018
Petrosyants K. O., Kozhukhov M., Dvornikov O. et al., , in: 23rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).: IEEE, 2017. P. 1–5.
Although it has been demonstrated that the SiGe HBTs can achieve faster unloaded circuit speed at cryogenic temperature than at room temperature, modelling of the SiGe HBTs at low temperature has been limited. It is known that the standard SPICE models of bipolar transistor are effective and guarantee the valid results only up to a ...
Added: July 16, 2018
Petrosyants K. O., Kozhukhov M., Dvornikov O. et al., , in: 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT). Proceedings.: M.: IEEE, 2018. Ch. 380 P. 1–4.
A unified SPICE macromodel of the SiGe HBTs taking into account radiation effects is presented. It consists of two parts: 1) the standard core model (GP, VBIC, HICUM, MEXTRAM) selected by the designer; 2) an additional subcircuit taking into account the radiation-induced current and voltage shifts. The macromodel was included on SPICE-like simulators. The advantages of SPICE-RAD ...
Added: May 30, 2018
Вологдин Э. Н., Lysenko A. P., М.: МИЭМ НИУ ВШЭ, 2018.
The main content of the training manual is:
consideration of the issues of the effect of radiation creating structural defects on the main parameters of bipolar transistors,
Consider issues related to the influence of ionization factors on the operation of transistors (radiation transients),
the effect of nuclear reactions and fast annealing on the parameters of transistors is considered;
Classification ...
Added: March 16, 2018