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Regular version of the site

Article

Improvement of injection and radiation stability of nanosized dielectric films of MOS devices

Inorganic Materials: Applied Research. 2011. Vol. 2. No. 5. P. 425-427.
Andreev V. V., Bondarenko G., Mihal'kov A. M., Stolyarov A. A., Solov'ev I. V.