Proceedings of the IEEE Latin-American Test Symposium (LATS-2016)

Нью-Йорк : The Institute of Electrical and Electronics Engineering, Inc., 2016.

Ответственный редактор: T. Balen

Под общей редакцией: M. S. Reorda

The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recongnized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. 

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Fault Simulation in Radiation-Hardened SOI CMOS VLSIs using Universal Compact MOSFET Model

Петросянц К. О., Самбурский Л. М., Харитонов И. А. и др., , in: Proceedings of the IEEE Latin-American Test Symposium (LATS-2016).: NY: The Institute of Electrical and Electronics Engineering, Inc., 2016. P. 117–122.

The methodology of modeling and simulation of environmentally induced faults in radiation hardened SOI CMOS ICs is presented. For this purpose, the universal compact SPICE SOI MOSFET model with account for TID, dose rate and single event effects is used. First, the model parameters extraction procedure is described in more details taking into consideration radiation ...

Добавлено: 14 апреля 2016 г.

Ключевые слова: Radiation/EMI, Test generation, Defect-based Test, Electromagnetic Compatibility, On-Line Testing, Yield Optimization