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Book

Proceedings of XV IEEE East-West Design & Test Symposium (EWDTS'2017)

Piscataway: IEEE, 2017.

The main target of the East-West Design & Test Symposium (EWDTS) is to exchange experiences between the scientists and technologies of the Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic systems. The symposium aims at attracting scientists especially from countries around the Black Sea, the Baltic states and Central Asia. We cordially invite you to participate and submit your contribution(s) to EWDTS’16 which covers (but is not limited to) the following topics:

  • Analog, Mixed-Signal and RF Test
  • Analysis and Optimization
  • ATPG and High-Level TPG
  • Automotive Reliability & Test
  • Built-In Self Test
  • Debug and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design Verification and Validation
  • EDA Tools for Design and Test
  • Embedded Software Performance
  • Failure Analysis, Defect and Fault
  • Functional Safely
  • High-level Synthesis
  • High-Performance Networks and Systems on a Chip
  • Internet of Things Design & Test
  • Low-power Design
  • Memory and Processor Test
  • Modeling & Fault Simulation
  • Network-on-Chip Design & Test
  • Modeling and Synthesis of Embedded Systems
  • Object-Oriented System Specification and Design
  • On-Line Testing
  • Power Issues in Design & Test
  • Real Time Embedded Systems
  • Reliability of Digital Systems
  • Scan-Based Techniques
  • Self-Repair and Reconfigurable Architectures
  • Signal and Information Processing in Radio and Communication Engineering
  • System Level Modeling, Simulation & Test Generation
  • System-in-Package and 3D Design & Test
  • Using UML for Embedded System Specification
  • Optical signals in communication and Information Processing
  • CAD and EDA Tools, Methods and Algorithms
  • Hardware Security and Design for Security
  • Logic, Schematic and System Synthesis
  • Place and Route
  • Thermal and Electrostatic Analysis of SoCs
  • Wireless and RFID Systems Synthesis

 

 

Chapters
Proceedings of XV IEEE East-West Design & Test Symposium (EWDTS'2017)