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Определение электрофизических параметров высокоомных полупроводников при подсветке образца красным излучением регулируемой интенсивности
Гл. 64. С. 441–444.
Lysenko A. P., Golubiatnikov V. A., Grigoryev F. I., Strogankova N. I., Белов А. Г.
It is known that illumination of the sample vysokomnogo semiconductor material significantly changes its electrical properties. It is shown that the contact regions of the sample illumination with monochromatic radiation intensity adjustable with a photon energy greater than the width of the forbidden zone of the test material, reduces the resistance of the sample, in some cases by several orders of magnitude. Provides a method for the separate determination of the resistance of the sample and contacts to it, which has been tested on a sample of semi-insulating n-GaAs. It is shown that the resistance of the sample volume and the total resistance of the contacts are close to each other and equal to about 5 108 ohms.
In book
М.: ОАО "НПО "Орион", 2014.