MILLIMETER-WAVE METAMATERIAL-BASED SENSOR FOR INHOMOGENEITY DETECTION AND PARAMETER CONTROL OF TECHNOLOGICAL SUBSTANCES
Modern level of technology development leads to higher requirements for parameters of devices. Deviations, inaccuracies and unwanted inhomogeneity can cause not only significant malfunction and errors, but a complete failure of the device. In this paper we propose to use a metamaterial-based frequency-selective surface for control of physical parameters of matter and for inhomogeneity detection. We used CST STUDIO SUITE 2015 to simulate the FSS and show that it can be used to accomplish the tasks stated.