The book of abstracts for the First African Light Source (AfLS) Conference and Workshop 2015.
We demonstrate the possibility of determining a large group of physical properties of DLC films using only one group of methods based on X-ray interference studies. These include methods for determination of the film thickness, material density and roughness of the surface. We present the analysis of possibilities to use the method of the two-crystal X-ray spectrometer to evaluate internal stress and to deduce the modules of elasticity and thermal expansion coefficients of the film. It is shown that this method can be used for the in-situ control jf the film parameters during the film deposition in the technological chamber.
The results of measurements of an electron density in a microwave plasma filament in dense gas (argon) are reported. The electron density has been determined on the basis of Stark broadening of lines detected in the absorption spectrum. A high-resolution spectrometer incorporating GaAlAs diode laser operating at 870 nm has been used to measure Stark broadening and shifts of the argon line. The electron density in the filament was found to increase from the initial level of 10 exp 12/cu cm to value n sub e greater than 10 exp 16/cu cm. The dependencies of the electron density on gas pressure and microwave power density are presented.