In this work authors presented new approach to investigation of multilayer heterostructures by joint calculation HRXRD and XRR data.
At present particular attention is given to techniques which allow the monitoring of single layer and multilayer thin film materials directly during their formation - in-situ methods. Application of these methods helps to ensure a film with desired characteristics, allowing quickly adjust process conditions. The paper describes the possibilities of the in-situ X-ray reflectivity to determine the parameters of nanoscale films in real time of their formation. Experimental results on the magnetron deposition of nanoscale Si films and other materials on silicon substrates are presented.
The effect of the chromium layer thickness on the magnetic state of an [Fe/Cr/Gd/Cr]n multilayer structure is studied. A series of Fe/Cr/Gd structures with Cr layer thicknesses of 4–30 Å is studied by SQUID magnetometry and ferromagnetic resonance in the temperature range 4.2–300 K. The obtained experimental results are described in terms of an effective field model, which takes into account a biquadratic contribution to the interlayer coupling energy and a nonuniform magnetization distribution inside the gadolinium layer (which was detected earlier). Depending on the magnetic field and temperature, the following types of mag netic ordering are identified at various chromium layer thicknesses: ferromagnetic, antiferromagnetic, and canted ordering. A comparison of the experimental and calculated curves allowed us to determine the depen dence of the bilinear (J1) and biquadratic (J2) exchange constants on chromium layer thickness tCr. Weak oscillations at a period of about 18 Å are detected in the J1(tCr) dependence in the range 8–30 Å. The exchange oscillations in the system under study are assumed to be related to the RKKY exchange interaction mechanism via the conduction electrons of Cr.