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Regular version of the site

Book chapter

Cтруктурные особенности кристаллов кремния, подвергнутых облучению протонами и термической обработке

С. 211-215.
Смирнов И. С., Новоселова Е. Г., Дьячкова И. Г.

The structure of silicon crystals implanted with protons was studied by methods of high-resolution X-ray diffraction . The distribution of strain in the disturbed layers was analyzed.