Оценка применимости микроволнового излучения для термообработки базальта и изделий из него
The dynamics of a two-component Davydov-Scott (DS) soliton with a small mismatch of the initial location or velocity of the high-frequency (HF) component was investigated within the framework of the Zakharov-type system of two coupled equations for the HF and low-frequency (LF) fields. In this system, the HF field is described by the linear Schrödinger equation with the potential generated by the LF component varying in time and space. The LF component in this system is described by the Korteweg-de Vries equation with a term of quadratic influence of the HF field on the LF field. The frequency of the DS soliton`s component oscillation was found analytically using the balance equation. The perturbed DS soliton was shown to be stable. The analytical results were confirmed by numerical simulations.
Tthe IMPI 48 program offers topics for everyone interested in learning about the latest developments in microwave power science and technology. Each year, IMPI brings together researchers, technologists and engineers from across the globe to share the latest findings of microwave and radio frequency power systems for non-communication applications, including food technology, chemical and material processing, and new emerging technologies. IMPI 48 Symposium was held at the Doubletree Hotel on Canal Street in downtown New Orleans, Louisiana, USA. New this year, IMPI 48’s Food Science and Technology Program will cover topics such as: microwavable food safety, microbiological testing, product validation, microwave oven standards, microwave leakage monitoring, industrial microwave and RF food processing.
In this study with using of the small-signal theory of discrete electron-wave interaction in the passbands and stopbands resonator slow-wave systems (SWS) of power traveling-wave tubes (TWT), obtain the characteristic equation for the propagation constants of the 4-electron waves produced in the interaction of the electron beam forward and backward electromagnetic waves of SWS. The analysis of solutions of this equation, which allowed to establish the specific characteristics of these waves are compared with the known properties of electron waves in a "smooth", such as helical SWS. On the basis of solving the boundary value problem for the SWS segments were simulated and found gain of multisection TWT with transparent section and stopsection, as well as, the distribution of fields and currents along the stopsection.
The computational model of the temperature sensors integrated on the IC chip with power transistors is developed. The 2D/3D problem of sensor placement is mathematically described by the classic heat transfer equation coupled with the equation for current density distribution. It is shown that parasitic effects of sensor current displacement and thermo-emf generation resulting from a temperature gradients (Seebeck effect) must be taken into account. For this purpose the special differential equation is introduced. The examples of point- and strip-like temperature sensors modeling for power BJTs and ICs are demonstrated.
Generalized error-locating codes are discussed. An algorithm for calculation of the upper bound of the probability of erroneous decoding for known code parameters and the input error probability is given. Based on this algorithm, an algorithm for selection of the code parameters for a specified design and input and output error probabilities is constructed. The lower bound of the probability of erroneous decoding is given. Examples of the dependence of the probability of erroneous decoding on the input error probability are given and the behavior of the obtained curves is explained.
This volume presents new results in the study and optimization of information transmission models in telecommunication networks using different approaches, mainly based on theiries of queueing systems and queueing networks .
The paper provides a number of proposed draft operational guidelines for technology measurement and includes a number of tentative technology definitions to be used for statistical purposes, principles for identification and classification of potentially growing technology areas, suggestions on the survey strategies and indicators. These are the key components of an internationally harmonized framework for collecting and interpreting technology data that would need to be further developed through a broader consultation process. A summary of definitions of technology already available in OECD manuals and the stocktaking results are provided in the Annex section.