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News
June 22, 2026
‘In Science, You Are Your Own Boss
Polina Nasledskova is interested in identifying gaps in linguistics and topics that have been overlooked by other researchers. In an interview for the  Young Scientists of HSE University project, she spoke about rare ordinal numerals in Nakh-Daghestanian languages, the benefits of knitting for concentration, and the beauty of the Patriarshy Bridge.
June 19, 2026
HSE Researchers Determine Which Internet Users Are More Likely to Fact-Check
Researchers at HSE University examined the strategies employed by Russian internet users to verify unreliable information and the factors that motivate them to do so. The study found that more than half of users who encounter potentially false information online attempt to verify it by locating the original source. The likelihood of fact-checking is influenced by several factors, including age, place of residence, social status, information literacy skills, and the use of AI. The findings have been published in Monitoring of Public Opinion: Economic and Social Changes.
June 5, 2026
'Im Used to Producing Distilled Knowledge'
Ivan Rubachev works in a HSE University laboratory established jointly with Yandex Research, where he focuses on machine learning with tabular data. In this interview with the HSE Young Scientists project, he discusses why following a vibe can be better than goal-setting, explains the concept of the Neural Turing Machine, and argues why withholding scientific knowledge is counterproductive.

 

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Использование инжекционно-термической обработки для уменьшения дефектности диэлектрических пленок МДП-структур

Перспективные материалы. 2025. № 5. С. 17–23.
Андреев Д. В., Корнев С. А., Bondarenko G., Андреев В. В.
Research target: Materials Technologies Electronics and Electrical Engineering
Language: Russian
Full text
Keywords: диэлектрические пленкиМДП-структурыdielectric filmsинжекционно-термическая обработкаinjection-thermal treatmentMIS structures
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Added: May 21, 2026
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Based on the obtained experimental data, a model is developed for the processes of a variation in the charge state of MIS (metal–insulator–semiconductor) structures under the concurrent influence of high-field tunneling electron injection and radiation. The model takes into account the interaction between injected electrons and charges appearing in the dielectric film due to radiation ...
Added: May 26, 2020
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