Book of Abstracts of the 3rd International Conference on Advanced Measurement and Test , Xiamen, China, March 13-14, 2013

Сямэнь : 2013.

AMT 2013 is the most comprehensive conference focused on the various aspects of advances in Advanced Measurement and Test. The conference provides a chance for academic and industry professionals to discuss recent progress in the area of Advanced Measurement and Test.  The goal of AMT 2013 is to bring together the researchers from academia and industry as well as practitioners to share ideas, problems and solutions relating to the multifaceted aspects of Advanced Measurement and Test.

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The Subsystem for MOSFETs Characteristic Measurement and Parameter Extraction with Account for Radiation Effects

Петросянц К. О., Харитонов И. А., Самбурский Л. М., , in: Book of Abstracts of the 3rd International Conference on Advanced Measurement and Test , Xiamen, China, March 13-14, 2013.: Xiamen: [б.и.], 2013. P. 35–36.

Hardware-software subsystem designed for MOSFETs characteristic measurement and SPICE model parameter extraction taking into account radiation effects is presented. Parts of the system are described. The macromodel approach is used to account for radiation effects in MOSFET modeling. Particularities of the account for radiation effects in MOSFETs within the measurement and model parameter extraction procedures are emphasized. ...

Добавлено: 29 апреля 2013 г.

Ключевые слова: measurement, test, electronics, new materials

ПУБЛИКАЦИЯ ПОДГОТОВЛЕНА ПО РЕЗУЛЬТАТАМ ПРОЕКТА: Разработка методов многоуровневого исследования и моделирования элементов перспективных изделий микроэлектроники от уровня материала до уровня схем с повышенной стойкостью к температурным и радиационным воздействиям (2013)