Optoelectronic Devices' Thermal Working Modes Providing Method
In this paper, we would like to suggest the algorithm of optoelectronic devices’ thermal working modes providing method. It solves the problem of gaining the projected working accuracy in high heat load including internal heat release on electronic components of printed circuit assemblies and optical part of optoelectronic device – the problem that is often faced by optoelectronic devices’ designers. We focus on implementation of this method in Zeeman-based frequency biasing laser gyroscope also known as Zeeman laser gyroscope. Below was given the example of the electronic assembly/component thermal model testing and Zeeman laser gyroscope thermal model was built. Note that the using method is applicable not only for Zeeman laser gyroscope but also for vast variety of optoelectronic devices. Implementation of this method in optoelectronic devices’ design allows us to get system approach and improve reliability and working accuracy to required levels.