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October 8, 2026
HSE Experts Take Part in 23rd Annual Meeting of Valdai Discussion Club
The 23rd Annual Meeting of the Valdai Discussion Club was held from September 28 to October 1, 2026 under the theme ‘Responsibility for the Future: Limits of the Possible, or Limitless Possibilities?’ The forum brought together 120 experts from 40 countries, including representatives of China, the United States, India, Brazil, the United Kingdom, Germany, Egypt, Iran, and Japan.
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The International N5 Symposium ‘Neural Networks and Nonlinearity in Nizhny Novgorod’ was held at the Nizhny Novgorod House of Scientists from September 23 to 26. The event was organised by HSE University–Nizhny Novgorod and the Nizhny Novgorod House of Scientists, with the participation of Sberbank and the Institute of Physics Belgrade. The symposium was held for the second time: the first conference took place in 2025 and attracted considerable interest from the academic community.

 

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SPICE-модели полевых транзисторов со структурой MOSFET и JFET для расширенного диапазона температуры до –200°C

С. 111–117.
Petrosyants K. O., Ismail-zade M. R., Sambursky L. M., Kharitonov I. A.

A set of modified compact spice models of field effect transistors is presented: with isolated gate (MOSFET) and with pn junction control (JFET) for circuit simulation in a temperature range of -200°C, which is important for space applications. All models are constructed using the approach combining macromodeling based on the standard models available in the library of spice models and introducing approximating dependencies for the temperature-dependent parameters of the model. For all models of the complex, a unified automated procedure for extraction of parameters has been worked out, providing an acceptable accuracy of electrical and temperature effects accounting for practical applications in the temperature range from room temperature to -200°C.

Language: Russian
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Keywords: model parameter extractionполевые транзисторыМОП-транзисторыMOSFETsэкстракция параметров моделиcompact SPICE modelsкомпактные SPICE-моделиJFETsfield-effect transistorstemperature influenceextreme operating conditionsJFET-транзисторытемпературное воздействиеэкстремальные условия работы

In book

Проблемы разработки перспективных микро- и наноэлектронных систем (МЭС-2018)
Вып. 3. , М., Зеленоград: ИППМ РАН, 2018.
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