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Regular version of the site

Book

Proceedings of IEEE East-West Design & Test Symposium (EWDTS’13)

Academic editor: V. Hahanov.
Editor-in-chief: S. Chumachenko, E. Litvinova.

The main target of the IEEE East-West Design & Test Symposium (EWDTS-2013) is to exchange experiences between scientists  and technologies of Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems. EWDTS’13 covers the following topics:

• Analog, Mixed-Signal and RF Test

• Analysis and Optimization

• EDA Tools for Design and Test

• Failure Analysis, Defect and Fault

• Modeling & Fault Simulation

• Power Issues in Testing

• Reliability of Digital Systems

• Thermal, Timing and Electrostatic Analysis of SoCs and Systems on Board

Chapters
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’13)