Book
Нанофизика и наноэлектроника. Труды XVIII Международного симпозиума (Нижний Новгород. 10-14 марта 2014 г.)
The dynamics of a two-component Davydov-Scott (DS) soliton with a small mismatch of the initial location or velocity of the high-frequency (HF) component was investigated within the framework of the Zakharov-type system of two coupled equations for the HF and low-frequency (LF) fields. In this system, the HF field is described by the linear Schrödinger equation with the potential generated by the LF component varying in time and space. The LF component in this system is described by the Korteweg-de Vries equation with a term of quadratic influence of the HF field on the LF field. The frequency of the DS soliton`s component oscillation was found analytically using the balance equation. The perturbed DS soliton was shown to be stable. The analytical results were confirmed by numerical simulations.
Description of batch piezo actuators, formulas for calculation of absolute and relative deformations in first and second approximation are brought. Example of modification of machine methods for more accurate calculation of anisotropic solids and more specifically of piezo ceramics is shown. Triaxial piezo actuator solution is suggested and it’s work scheme is described. Disadvantages of batch piezo actuators and methods of their removal are shown
The texts of papers presented at the workshop on "X-Ray Optics - 2010" are published. Topics of the meeting included the following topics: X-ray crystal optics, multilayer optics for X-ray and extreme ultraviolet, X-ray technology of optical elements, the use of X-ray optics for the study of micro-and nanostructures, X-ray lithography, X-ray microscopy and imaging, new methods of micro-and nanostructures studies using synchrotron and laboratory X-ray sources.
Heat pipes application in nanotechnological equipment is considered on examples of probe movement manipulators. Approaches to improvements of manipulators for effective heat extraction from operating area are shown.
We propose a method for high-sensitivity subwavelength spectromicroscopy based on the usage of a spaser (plasmonic nanolaser) in the form of a scanning probe microscope tip. The high spatial resolution is defined by plasmon localization at the tip, as is the case for apertureless scanning near-field optical microscopy. In contrast to the latter method, we suggest using radiationless plasmon pumping with quantum dots instead of irradiation with an external laser beam. Due to absorption at the transition frequencies of neighboring nano-objects (molecules or clusters), dips appear in the plasmon generation spectrum. The highest sensitivity is achieved near the generation threshold.
Generalized error-locating codes are discussed. An algorithm for calculation of the upper bound of the probability of erroneous decoding for known code parameters and the input error probability is given. Based on this algorithm, an algorithm for selection of the code parameters for a specified design and input and output error probabilities is constructed. The lower bound of the probability of erroneous decoding is given. Examples of the dependence of the probability of erroneous decoding on the input error probability are given and the behavior of the obtained curves is explained.
This volume presents new results in the study and optimization of information transmission models in telecommunication networks using different approaches, mainly based on theiries of queueing systems and queueing networks .
The paper provides a number of proposed draft operational guidelines for technology measurement and includes a number of tentative technology definitions to be used for statistical purposes, principles for identification and classification of potentially growing technology areas, suggestions on the survey strategies and indicators. These are the key components of an internationally harmonized framework for collecting and interpreting technology data that would need to be further developed through a broader consultation process. A summary of definitions of technology already available in OECD manuals and the stocktaking results are provided in the Annex section.