Построение тестов цифровых схем с неисправностями открытого типа с использованием непрерывного подхода к моделированию
This paper considers the development of digital circuit tests using continuous models of discrete devices. An algorithm is presented which makes it possible to solve the problem of finding test sets using continuous optimization. A generalized fault model is proposed which implements a unified approach to the representation of different types of faults in test generation. The proposed approach is implemented as a software environment for research and development of fault models and algorithms for finding digital circuit tests. For testing, a system of automated test generation for constant faults of combinational circuits has been built. The performance estimation results for the software package developed for the ISCAS '85 benchmark circuits demonstrate the effectiveness of the algorithms and methods used.
This proceedings publication is a compilation of selected contributions from the “Third International Conference on the Dynamics of Information Systems” which took place at the University of Florida, Gainesville, February 16–18, 2011. The purpose of this conference was to bring together scientists and engineers from industry, government, and academia in order to exchange new discoveries and results in a broad range of topics relevant to the theory and practice of dynamics of information systems. Dynamics of Information Systems: Mathematical Foundation presents state-of-the art research and is intended for graduate students and researchers interested in some of the most recent discoveries in information theory and dynamical systems. Scientists in other disciplines may also benefit from the applications of new developments to their own area of study.