A tutorial on aphasia test development in any language: Key substantive and psychometric considerations
Background: There are a limited number of aphasia language tests in the majority of the
world’s commonly spoken languages. Furthermore, few aphasia tests in languages other
than English have been standardised and normed, and few have supportive psychometric
data pertaining to reliability and validity. The lack of standardised assessment tools
across many of the world’s languages poses serious challenges to clinical practice and
research in aphasia.
Aims: The current review addresses this lack of assessment tools by providing conceptual
and statistical guidance for the development of aphasia assessment tools and establishment
of their psychometric properties.
Main Contribution: A list of aphasia tests in the 20 most widely spoken languages is
included. The pitfalls of translating an existing test into a new language versus creating a
new test are outlined. Factors to be considered in determining test content are discussed.
Further, a description of test items corresponding to different language functions is provided,
with special emphasis on implementing important controls in test design. Next, a
broad review of principal psychometric properties relevant to aphasia tests is presented,
with specific statistical guidance for establishing psychometric properties of standardised
Conclusions: This article may be used to help guide future work on developing, standardising
and validating aphasia language tests. The considerations discussed are also
applicable to the development of standardised tests of other cognitive functions.
The considered model of the failure rate of CMOS VHSIC design proposed in the article Piskun G.A., Alekseev V.F., "Improvement of mathematical models calculating of CMOS VLSIC taking into account features of impact of electrostatic discharge", published in the first issue of the journal "Technologies of electromagnetic compatibility" for the year 2016. It is shown that the authors claim that this model "...will more accurately assess the reliability of CMOS VHSIC design" is fundamentally flawed and its application will inevitably lead to inadequate results. Alternatively, the proposed model of the failure rate of CMOS VHSIC design, which also allows to take into account the views of ESD, but based on the use of resistance characteristics of CMOS VHSIC to the effects of ESD.
The article considers the questions assessing the reliability of mechanical components used in the electronic equipment in the early stages of design. The calculations of failure rates springs shock absorbers according to various methods. It is shown that the use of models failure rates of mechanical elements, taking into account the peculiarities of their structural and technological performance, not only allows us to solve the problem of calculating, but also to ensure the required level of reliability and mechanical components, and containing electronic equipment.
The article is devoted to the problem of selfdisclosure of a personality as implicit readiness to active self-fulfillment. The author examines positive and negative consequences of self-disclosure in communication and studies temporal boundaries, time and relevance of self-disclosure of a person in dyadic, interpersonal and inter-group relationship.
The monograph presents results by professor Dr. A. Shalumov’s Research School of Modeling, Information Technology and Automated Systems (Russia). The program, ASONIKA, developed by the school is reviewed here regarding reliability and quality of devices for simulation of electronics and chips during harmonic and random vibration, single and multiple impacts, linear acceleration and acoustic noise, and steady-state and transient thermal effects. Calculations are done for thermal stress during changes in temperature and power in time. Calculations are done for number of cycles to fatigue failure under mechanical loads as well as under cyclic thermal effects. Simulation results for reliability analysis are taken into account. Models, software interface, and simulation examples are presented.
For engineers and scientists involved in design automation of electronics.
Mathematical models of failure rate of refusals the elements applied in calculations of reliability of the onboard electronic equipment are considered. Possibility of application the models given in foreign standards, for forecasting of reliability of completing elements is shown.
The basic influencing the factor defining its reliability are temperature influences at which speed of chemical reaction of materials a part REE increases. It is represented the equation which has been received by the Swedish chemist Svante Arreniusom from thermodynamic reasons
Maintenance of reliability of radio-electronic equipment taking into account thermal modes for various classes of electroradioproducts (ERP) within the limits of system ASONIKA is considered.
51st Academy of Aphasia Proceedings
Full preparation for taking the Russian State Exam in English with diagnostic tests, exam-type exercises and several full-size practice tests.
The paper is focused on the study of reaction of italian literature critics on the publication of the Boris Pasternak's novel "Doctor Jivago". The analysys of the book ""Doctor Jivago", Pasternak, 1958, Italy" (published in Russian language in "Reka vremen", 2012, in Moscow) is given. The papers of italian writers, critics and historians of literature, who reacted immediately upon the publication of the novel (A. Moravia, I. Calvino, F.Fortini, C. Cassola, C. Salinari ecc.) are studied and analised.
In the article the patterns of the realization of emotional utterances in dialogic and monologic speech are described. The author pays special attention to the characteristic features of the speech of a speaker feeling psychic tension and to the compositional-pragmatic peculiarities of dialogic and monologic text.