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Article

О природе дефектного слоя в образцах молекулярно допированных полимеров

The shape of time-of-flight curves in the mode of subsurface irradiation of samples with lowenergy electrons is analyzed for free_standing films of a typical molecularly doped polymer of different thicknesses (11–45 μm). Special attention is paid to comparison of curves registered for both sides of the samples. The data confirm the hypothesis that the defective layer is formed owing to sublimation of dopant molecules during sample preparation and qualitatively agree with predictions of the two_layer multiple_trapping model.

29.19.23 Теория электрических свойств твердых тел

29.19.25 Взаимодействие проникающего излучения с твердыми телами