Методика определения параметров SPICE-моделей для анализа влияния ОЯЧ на КМОП-схемы при уменьшении размеров транзисторов
The paper deals with SPICE models of varying complexity for analyzing the heavy (nuclear) particles impact on CMOS circuits. For the version of the model that takes into account the influence of the electric bias on the parameters of the current pulse, expressions have been given for evaluating the main model parameters, depending on the parameters of the particle track and the structure of the MOS transistors. The influence of MOSFET scaling on SEU and SEE model parameters has been shown. Comparison of single event current pulses for the described model and data from the literature with different sizes have been presented and analyzed.