Исследование динамики емкостей перегонов в модели организации грузоперевозок между двумя узловыми станциями
The considered model of the failure rate of CMOS VHSIC design proposed in the article Piskun G.A., Alekseev V.F., "Improvement of mathematical models calculating of CMOS VLSIC taking into account features of impact of electrostatic discharge", published in the first issue of the journal "Technologies of electromagnetic compatibility" for the year 2016. It is shown that the authors claim that this model "...will more accurately assess the reliability of CMOS VHSIC design" is fundamentally flawed and its application will inevitably lead to inadequate results. Alternatively, the proposed model of the failure rate of CMOS VHSIC design, which also allows to take into account the views of ESD, but based on the use of resistance characteristics of CMOS VHSIC to the effects of ESD.
Theorems of existence and uniqueness of Cauchy’s problem solution for systems of nonlinear functional and differential equations are proved. During the proof of the theorems the positivity of the Cauchy’s matrix corresponding linear system is used essentially.
The article presents the results of experimental and theoretical studies of the dynamics of the process of electric discharge sawing by wire tool electrode aimed at solving problems of control