33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM). PROCEEDINGS 2017

Денвер : IEEE, 2017.

The 2017 Semiconductor Thermal Measurement and Management (SEMI-THERM) Symposium is an annual international forum for the presentation of new developments in and applications relating to generation and removal of heat within semiconductor devices, and measurement of junction temperatures under various application and environmental conditions. Attendance at the Symposium is limited, to preserve the close interaction among attendees and presenters. The format of the symposium this year couples nine sessions of selected technical papers, a more-intimate Poster Session for one-on-one discussion of results, a luncheon talk, and a series of Workshops focused on products and techniques and an embedded tutorial.

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High temperature submicron SOI CMOS technology characterization for analog and digital applications up to 300°C

Петросянц К. О., Lebedev S., Самбурский Л. М. и др., , in: 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM). PROCEEDINGS 2017.: Denver: IEEE, 2017. P. 229–234.

Добавлено: 9 июня 2017 г.