Установка для измерения температурной зависимости показателя преломления твердых тел

Приборы и техника эксперимента. 2010. Т. 53. № 1. С. 159–164.

Lapshinov B. A., Magunov A. N.

A setup for measuring the temperature dependences of refractive indices n(T) of semiconductors and dielectrics in the temperature range 300–700 K at the wavelengths of a He–Ne laser л = 0.63, 1.15, and 3.39 µm is described. Samples in the form of plane–parallel plates serve as Fabry–Perot etalons the optical thickness of which depends on the temperature. Upon heating and subsequent cooling of a sample, interfererence oscillations of the reflected_light intensity are recorded and used to determine the dependence n(T). The values of the refractive index at room temperature and the thermal expansion coefficient used in calculations are taken from the literature. Comparing the interferograms obtained for a heated and cooled sample allows evaluation of the temperature difference between the sample’s probed area and a measuring thermocouple. The relative error in determining thermooptical coefficient dn/dT in the range 300–700 E is within 1%.

Keywords: показатель преломления, лазерное излучение, interference thermometry, semiconductors, dielectrics, refractive indices, laser radiation, automated setup, интерференционная термометрия, полупроводники, диэлектрики, автоматизированная регистрация