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Book chapter

Calculation of The Absorbed Dose of Electron Radiation in Polymer Cases of Microelectronic Devices, Considering the Factor of Its Accumulation

P. 1-5.
Translator: D. Abrameshin.

A computer simulation of the depth course of the absorbed dose as a function of the electronic irradiation energy of the acting in the range of 30 – 60 keV was performed, and calculations of the dose accumulation factor under these conditions were performed for polyethylene terephthalate, polymethylmethacrylate, polystyrene and low-density polyethylene, as model polymers of microelectronic device housings. It is shown that the electron energy values corresponding to the maximum dose accumulation factor depend on the polymer density. The conducted studies allow us to determine with great accuracy the conductivity of plastic cases of microelectronic devices under conditions of electronic irradiation, which is of particular interest to exclude the physical possibility of the occurrence of electrostatic discharges that lead to failures of the onboard electronics of spacecraft.