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Article

Рентгеновская топография: вчера, сегодня и перспективы

Суворов Э. В.

X-ray topography is a complex of X-ray diffraction methods allowing one to detect the images of defects, to

determine their type, the arrangement in a crystal structure volume or on its surface, to measure their basic

characteristics. The possibilities, limitations and prospects of X-ray topography methods are discussed in the

given work.