This paper considers the development of digital circuit tests using continuous models of discrete devices. An algorithm is presented which makes it possible to solve the problem of finding test sets using continuous optimization. A generalized fault model is proposed which implements a unified approach to the representation of different types of faults in test generation. The proposed approach is implemented as a software environment for research and development of fault models and algorithms for finding digital circuit tests. For testing, a system of automated test generation for constant faults of combinational circuits has been built. The performance estimation results for the software package developed for the ISCAS '85 benchmark circuits demonstrate the effectiveness of the algorithms and methods used.
An approach to construction of digital circuit tests on the basis of continuous models of discrete devices is developed. The method is used to solve the problem of finding test sets for bridging faults of sequential circuits. A generalized fault model representation specified with a resistive model of a bridging fault is used together with simulation algorithms of a sequential circuit using continuous functions. The described algorithms and methods are implemented in the software package of automated test construction. The approbation results for some ISCAS'89 benchmark circuits are presented.