Измерения электрических характеристик биполярных и МОП-транзисторов под действием радиации
In this paper we analyze details of bipolar transistors and MOSFETs electrical characteristics measurement in the presence of neutron, electron and gamma irradiation. An automated measurement subsystem is developed with its core being a measurement kernel comprising a set of measurement instrumentation as well as methods of measurement and data processing for irradiated transistors of various types. Provided are several examples of the subsystem application to BJTs and MOSFETs radiation hardness investigation as well as extraction of their SPICE model parameters for circuit design.
The questions of physics of bipolar transistors. Although the list of educational and scientific literature, which dealt with questions of the theory of transistors, very large, many years of experience teaching this section, solid-state electronics shows that universal tutorial not. An attempt is made to present fairly complex physical processes in the most simplified form. The formulas and diagrams necessary for students to complete course work in the above disciplines.
Process mining is a new direction in the field of modeling and analysis of processes, where using information from event logs, describing the history of the system behavior, plays an important role. Methods and approaches used in the process mining are often based on various heuristics, and experiments with large event logs are crucial for the study and comparison of the developed methods and algorithms. Such experiments are very time consuming, so automation of experiments is an important task in the field of process mining. This paper presents the language DPMine developed specifically to describe and carry out experiments on the discovery and analysis of process models. The basic concepts of the DPMine language, as well as principles and mechanisms of its extension are described. Ways of integration of the DPMine language as dynamically loaded components into the VTMine modeling tool are considered. An illustrating example of an experiment to build a fuzzy model of the process discovered from the log data stored in a normalized database is given.
Generalized error-locating codes are discussed. An algorithm for calculation of the upper bound of the probability of erroneous decoding for known code parameters and the input error probability is given. Based on this algorithm, an algorithm for selection of the code parameters for a specified design and input and output error probabilities is constructed. The lower bound of the probability of erroneous decoding is given. Examples of the dependence of the probability of erroneous decoding on the input error probability are given and the behavior of the obtained curves is explained.
The dynamics of a two-component Davydov-Scott (DS) soliton with a small mismatch of the initial location or velocity of the high-frequency (HF) component was investigated within the framework of the Zakharov-type system of two coupled equations for the HF and low-frequency (LF) fields. In this system, the HF field is described by the linear Schrödinger equation with the potential generated by the LF component varying in time and space. The LF component in this system is described by the Korteweg-de Vries equation with a term of quadratic influence of the HF field on the LF field. The frequency of the DS soliton`s component oscillation was found analytically using the balance equation. The perturbed DS soliton was shown to be stable. The analytical results were confirmed by numerical simulations.
Radiation conditions are described for various space regions, radiation-induced effects in spacecraft materials and equipment components are considered and information on theoretical, computational, and experimental methods for studying radiation effects are presented. The peculiarities of radiation effects on nanostructures and some problems related to modeling and radiation testing of such structures are considered.
This volume presents new results in the study and optimization of information transmission models in telecommunication networks using different approaches, mainly based on theiries of queueing systems and queueing networks .
The paper provides a number of proposed draft operational guidelines for technology measurement and includes a number of tentative technology definitions to be used for statistical purposes, principles for identification and classification of potentially growing technology areas, suggestions on the survey strategies and indicators. These are the key components of an internationally harmonized framework for collecting and interpreting technology data that would need to be further developed through a broader consultation process. A summary of definitions of technology already available in OECD manuals and the stocktaking results are provided in the Annex section.