Влияние низкоинтенсивной радиации на СВЧ-устройства
Electronic equipment of spacecraft is exposed to ionizing radiation of outer space, which is another reason for failure. Currently accepted to evaluate separately the reliability of electronic equipment and its radiation resistance, despite the fact that these phenomena are interrelated. The aim of the article is to estimate effects of ionizing radiation on the reliability of microwave devices, namely, the probability of failure-free operation of a microwave amplifier.
The probability of device failure model Q(t) for active lifetime is constructed as a product of the probabilities of failure Q1(t) - the probability of device failure due to set the total ionizing dose, Q2(t) - probability of failure of the device in the absence of exposure to ionizing radiation, Q3(t) - the probability of a single effect event. Probabilities Q2(t) and Q3(t) are valued at current normative documents. Probability Q1(t) is calculated based on probabilistic and physical models.
Research shows that, despite the high radiation resistance of microwave devices used in electronic equipment of spacecraft, when the long lifetime is required the low intensity radiation will have a tangible impact on the probability of failure. And that should be considered when designing equipment.
The considered model of the failure rate of CMOS VHSIC design proposed in the article Piskun G.A., Alekseev V.F., "Improvement of mathematical models calculating of CMOS VLSIC taking into account features of impact of electrostatic discharge", published in the first issue of the journal "Technologies of electromagnetic compatibility" for the year 2016. It is shown that the authors claim that this model "...will more accurately assess the reliability of CMOS VHSIC design" is fundamentally flawed and its application will inevitably lead to inadequate results. Alternatively, the proposed model of the failure rate of CMOS VHSIC design, which also allows to take into account the views of ESD, but based on the use of resistance characteristics of CMOS VHSIC to the effects of ESD.
The article considers the questions assessing the reliability of mechanical components used in the electronic equipment in the early stages of design. The calculations of failure rates springs shock absorbers according to various methods. It is shown that the use of models failure rates of mechanical elements, taking into account the peculiarities of their structural and technological performance, not only allows us to solve the problem of calculating, but also to ensure the required level of reliability and mechanical components, and containing electronic equipment.
The article is devoted to the problem of selfdisclosure of a personality as implicit readiness to active self-fulfillment. The author examines positive and negative consequences of self-disclosure in communication and studies temporal boundaries, time and relevance of self-disclosure of a person in dyadic, interpersonal and inter-group relationship.
The monograph presents results by professor Dr. A. Shalumov’s Research School of Modeling, Information Technology and Automated Systems (Russia). The program, ASONIKA, developed by the school is reviewed here regarding reliability and quality of devices for simulation of electronics and chips during harmonic and random vibration, single and multiple impacts, linear acceleration and acoustic noise, and steady-state and transient thermal effects. Calculations are done for thermal stress during changes in temperature and power in time. Calculations are done for number of cycles to fatigue failure under mechanical loads as well as under cyclic thermal effects. Simulation results for reliability analysis are taken into account. Models, software interface, and simulation examples are presented.
For engineers and scientists involved in design automation of electronics.
Mathematical models of failure rate of refusals the elements applied in calculations of reliability of the onboard electronic equipment are considered. Possibility of application the models given in foreign standards, for forecasting of reliability of completing elements is shown.
The basic influencing the factor defining its reliability are temperature influences at which speed of chemical reaction of materials a part REE increases. It is represented the equation which has been received by the Swedish chemist Svante Arreniusom from thermodynamic reasons
The monograph contents totaled the many years results of Scientific school «The Automated System for Ensuring of Reliability and Quality of Equipment - ASONIKA» National research University «Higher school of Economics» (scientific supervisor of the Scientific school - academician of RANS, doctor of technical sciences, professor YU. Kofanov) and long-term cooperation with the scientists of Kiev Institute of mathematical machines and systems problems of the Ukrainian National Sciences Academy (Deputy Director on science, doctor of technical sciences V.P. Strelnikov). The final structure of the monograph had been formed in the discussion of modern problems of reliability aerospace electronic equipment at the XVII International scientific-technical conference «Systemic problems of reliability, quality, mathematical modelling, information and infocommunication technologies in innovation projects». This conference was dedicated to the 20th anniversary of the HSE. The book outlines the basics of probability-physical approach to the study and the assessment of the reliability of onboard aerospace equipment. Presents the methods of estimation of reliability parameters of electronic components, as according to reference data and test or operating results in the presence or absence of failures. Developed the methods of calculation of reliability parameters of mechanical elements of aerospace equipment as well as research methods reliability of redundant and non-redundant, non-renewable and renewable systems on the basis of adequate two-parameter distributions of diffusion. Established the theory of planning reliability test with lightweight, durable, including accelerated testing with new methods of processing the testing results and reliability assessment. We propose new methods of evaluation and prediction of the aerospace equipment reliability to measure the determining parameters. Developed methodology of the statistical characteristics evaluation of the degradation process for the study of single samples of aerospace equipment using information about its representative minobject (minibranch, mineralizatsiya). All problems of reliability, which is solved in this book (mathematical modeling, calculation and experimental evaluation of the reliability of systems) result in the identification of the time until failure (or to failure) distribution. It is proved that when assessing the reliability of onboard aerospace equipment, most accurate results diffusion DN-distribution. On the basis of the law of distribution can be carried out the evaluation of all the necessary parameters of aerospace equipment reliability (mathematical expectations developments, gamma-interest developments, the probability of non-failure operating time for the specified time, the residual resource and others). The book provides a large number of examples and problems, proving the effectiveness and efficiency of the proposed methods. Material monograph mostly taught HSE in the various courses of lectures. The monograph is intended for a wide circle of specialists working in the field design, testing and operation of onboard aerospace equipment, as well as students and graduate students of the HSE in the execution of their coursework, independent scientific research, and the preparation of graduation theses and dissertations.
Maintenance of reliability of radio-electronic equipment taking into account thermal modes for various classes of electroradioproducts (ERP) within the limits of system ASONIKA is considered.
Statistical Models and Methods for Reliability and Survival Analysis is a volume of contributions by specialists in statistical theory and their applications that provide up-to-date developments in methods used in survival analysis, statistical goodness of fit, stochastic processes for system reliability among others. Many of them are related to the work of Professor M. Nikulin in statistics for thirty years. The contributors accepted this challenging project to gather various contributions with a wide broad of techniques and results, all of them in the topics of the past S2MRSA conference dedicated to M. Nikulin for his twentieth anniversary as a Professor in the Bordeaux Segalen University. The book is intended for researchers interested in statistical methodology and models useful in survival analysis, system reliability and statistical testing for censored and non censored data.
Generalized error-locating codes are discussed. An algorithm for calculation of the upper bound of the probability of erroneous decoding for known code parameters and the input error probability is given. Based on this algorithm, an algorithm for selection of the code parameters for a specified design and input and output error probabilities is constructed. The lower bound of the probability of erroneous decoding is given. Examples of the dependence of the probability of erroneous decoding on the input error probability are given and the behavior of the obtained curves is explained.
The dynamics of a two-component Davydov-Scott (DS) soliton with a small mismatch of the initial location or velocity of the high-frequency (HF) component was investigated within the framework of the Zakharov-type system of two coupled equations for the HF and low-frequency (LF) fields. In this system, the HF field is described by the linear Schrödinger equation with the potential generated by the LF component varying in time and space. The LF component in this system is described by the Korteweg-de Vries equation with a term of quadratic influence of the HF field on the LF field. The frequency of the DS soliton`s component oscillation was found analytically using the balance equation. The perturbed DS soliton was shown to be stable. The analytical results were confirmed by numerical simulations.
By using superconducting quantum interference device (SQUID) magnetometry, we investigated anisotropic high-field (H less than or similar to 7T) low-temperature (10 K) magnetization response of inhomogeneous nanoisland FeNi films grown by rf sputtering deposition on Sitall (TiO2) glass substrates. In the grown FeNi films, the FeNi layer nominal thickness varied from 0.6 to 2.5 nm, across the percolation transition at the d(c) similar or equal to 1.8 nm. We discovered that, beyond conventional spin-magnetism of Fe21Ni79 permalloy, the extracted out-of-plane magnetization response of the nanoisland FeNi films is not saturated in the range of investigated magnetic fields and exhibits paramagnetic-like behavior. We found that the anomalous out-of-plane magnetization response exhibits an escalating slope with increase in the nominal film thickness from 0.6 to 1.1 nm, however, it decreases with further increase in the film thickness, and then practically vanishes on approaching the FeNi film percolation threshold. At the same time, the in-plane response demonstrates saturation behavior above 1.5-2T, competing with anomalously large diamagnetic-like response, which becomes pronounced at high magnetic fields. It is possible that the supported-metal interaction leads to the creation of a thin charge-transfer (CT) layer and a Schottky barrier at the FeNi film/Sitall (TiO2) interface. Then, in the system with nanoscale circular domains, the observed anomalous paramagnetic-like magnetization response can be associated with a large orbital moment of the localized electrons. In addition, the inhomogeneous nanoisland FeNi films can possess spontaneous ordering of toroidal moments, which can be either of orbital or spin origin. The system with toroidal inhomogeneity can lead to anomalously strong diamagnetic-like response. The observed magnetization response is determined by the interplay between the paramagnetic-and diamagnetic-like contributions.
This volume presents new results in the study and optimization of information transmission models in telecommunication networks using different approaches, mainly based on theiries of queueing systems and queueing networks .
The paper provides a number of proposed draft operational guidelines for technology measurement and includes a number of tentative technology definitions to be used for statistical purposes, principles for identification and classification of potentially growing technology areas, suggestions on the survey strategies and indicators. These are the key components of an internationally harmonized framework for collecting and interpreting technology data that would need to be further developed through a broader consultation process. A summary of definitions of technology already available in OECD manuals and the stocktaking results are provided in the Annex section.