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October 19, 2026
'Cultural Studies Seeks to Understand What Lies Beneath the Surface of Everyday Things'
Maxim Zhiganov has been exploring different aspects of sound for many years—first in relation to his native Perm and then on a broader, global scale. In this interview for the HSE Young Scientists project, he talks about sound maps, the special issue of the journal Logos, and why it is important to make the familiar less clear and obvious.
October 14, 2026
At HSE University–St Petersburg, Experts Discuss How AI Changes Tourist Routes and Cultural Heritage
Neural networks are no longer simple travel assistants; now they decide what to include on the route and what to skip. Artificial intelligence changes how people perceive a place and shapes the image of tourist centres. At the II International Scientific and Practical Conference ’Information Technologies in the Preservation and Promotion of Cultural Heritage,’ researchers discussed who controls algorithmic solutions and in what ways, and whether authentic traditions get lost in them.
October 12, 2026
Road Injuries Leading Cause of Death Among Men Aged 10 to 39
Worldwide, road injuries are the leading cause of death among males aged 10–39. An international team of researchers reached this conclusion as part of the Global Burden of Disease Study 2023, analysing data from 204 countries between 1990 and 2023. Their findings have been published in The Lancet Public Health, with HSE University Professor Vasily Vlassov listed among the collaborators.

 

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Proceedings of the IEEE Latin-American Test Symposium (LATS-2016)

The Institute of Electrical and Electronics Engineering, Inc., 2016.

The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recongnized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind.

Language: English
Sample Chapter
Keywords: Radiation/EMITest generationDefect-based TestElectromagnetic CompatibilityOn-Line TestingYield OptimizationTest generationDefect-based TestElectromagnetic CompatibilityFault Modeling
Publication based on the results of:
Моделирование воздействия тепловых и радиационных эффектов на микроэлектронные компоненты (2015)
Proceedings of the IEEE Latin-American Test Symposium (LATS-2016)
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NY: The Institute of Electrical and Electronics Engineering, Inc., 2016.
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