Development of a Hardware and Software Complex Based on the Study of the Diagnostic Properties of Methods for Testing Nonvolatile Memory with a Serial Interface

P. 1–6.

Alexander L. Tuv, Maxim S. Akatov, Diana I. Nalegach, Nikita A. Bezborodov

This paper investigates the diagnostic abilities of 
test  sequences  developed  for  detecting  defects  in  non-volatile 
memory with a serial interface. The most common fault models 
are considered, algorithms for monitoring non-volatile memory 
are  described.  A  comparative  analysis  of  the  complexity  of 
marching tests is carried out and faster control algorithms are 
proposed. The study was conducted as part of the development 
of  a  hardware  and  software  complex  for  testing  non-volatile 
memory. The article presents the architecture of the complex 
and  describes  the  schemes  for  testing  static  parameters  of 
memory chips. 

Keywords: nonvolatile memory, serial interface

In book

Proceedings of 2022 IEEE Moscow Workshop on Electronic and Networking Technologies (MWENT)

M.: IEEE, 2022.