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✖Traveling wave tubes are actively used in various radio transmitting devices. However, the analysis of modern literature sources showed that there are no mathematical models that allow to take into account the influence of technical parameters of traveling wave tubes on the failure rate, and, as a consequence, on the time to failure and resource.
For the effective functioning of the onboard avionics, require sealing. Gasket failure rate directly affects the probability of successful operation of the device in a sealed condition. Gasket failure rate, in turn, depends on many factors.
The considered model of the failure rate of CMOS VHSIC design proposed in the article Piskun G.A., Alekseev V.F., "Improvement of mathematical models calculating of CMOS VLSIC taking into account features of impact of electrostatic discharge", published in the first issue of the journal "Technologies of electromagnetic compatibility" for the year 2016. It is shown that the authors claim that this model "...will more accurately assess the reliability of CMOS VHSIC design" is fundamentally flawed and its application will inevitably lead to inadequate results. Alternatively, the proposed model of the failure rate of CMOS VHSIC design, which also allows to take into account the views of ESD, but based on the use of resistance characteristics of CMOS VHSIC to the effects of ESD.
Mathematical models of failure rate of refusals the elements applied in calculations of reliability of the onboard electronic equipment are considered. Possibility of application the models given in foreign standards, for forecasting of reliability of completing elements is shown.
Consider the dependence of coefficient of quality equipment from a variety of factors and its influence on the reliability of modern software and hardware systems. In terms of reliability software and hardware systems are serial connection elements. For them, the prediction model of the failure rate in the mode of operation depends on the technical means failure rate, the Software Tool failure rate and coefficient of quality equipment.
The article considers the questions assessing the reliability of mechanical components used in the electronic equipment in the early stages of design. The calculations of failure rates springs shock absorbers according to various methods. It is shown that the use of models failure rates of mechanical elements, taking into account the peculiarities of their structural and technological performance, not only allows us to solve the problem of calculating, but also to ensure the required level of reliability and mechanical components, and containing electronic equipment.
A linear theory of the discrete interaction of electron beams and electromagnetic waves in slow-wave structures (SWS) is developed. The theory is based on the finite_difference equations of SWS excitation.The local coupling impedance entering these equations characterizes the field intensity excited by the electron beam in interaction gaps and has a finite value at SWS cutoff frequencies. The theory uniformly describes the electron–wave interaction in SWS passbands and stopbands without using equivalent circuits, a circumstance that allows considering the processes in the vicinity of cutoff frequencies and switching from the Cerenkov mechanism of interaction in a traveling wave tube to the klystron mechanism when passing to SWS stopbands. The features of the equations of the discrete electron–wave interaction in pseudoperiodic SWSs are analyzed.