Автоматизация инженерной методики прогнозирования долговечности интегральных микросхем иностранного производства
The work touches upon the acute problems of carrying out accelerated tests purchased by foreign countries (the United States, Japan, China, etc.) of integrated circuits (IC) and the absence of reliability data from electronic components on the basis of the Reliability Report of data on the parameters of durability. It is proposed to apply the developed methodology for predicting the longevity of the IMS by using the Reliability Report and calculating the necessary parameters. Also shown is a block diagram of the program for automating the calculation of indices of longevity of foreign manufacturers of foreign manufacturers.