Analysis of temperature-current rise in modern PCB traces by means of thermography
Higher functionality of today’s electronic products demands high density integration of electronic components. In this field, printed-circuit-board (PCB) are the perspective technology to build a variety of electronic systems for different applications. Two types of boards were investigated: high current for power applications and high density boards for modern electronic equipment. The set of IR images and temperature-current diagrams for different substrate materials were investigated. Current and temperature limits for all test boards were defined to provide high level of board relectronic system reliability.
The considered model of the failure rate of CMOS VHSIC design proposed in the article Piskun G.A., Alekseev V.F., "Improvement of mathematical models calculating of CMOS VLSIC taking into account features of impact of electrostatic discharge", published in the first issue of the journal "Technologies of electromagnetic compatibility" for the year 2016. It is shown that the authors claim that this model "...will more accurately assess the reliability of CMOS VHSIC design" is fundamentally flawed and its application will inevitably lead to inadequate results. Alternatively, the proposed model of the failure rate of CMOS VHSIC design, which also allows to take into account the views of ESD, but based on the use of resistance characteristics of CMOS VHSIC to the effects of ESD.
Many electronic devices operate in a cyclic mode. This should be considered when forecastingreliability indicators at the design stage.The accuracy of the prediction and the planning for the event to ensure reliability depends on correctness of valuation and accounting greatest possiblenumber of factors. That in turn will affect the overall progress of the design and, in the end,result in the quality and competitiveness of products
The basic influencing the factor defining its reliability are temperature influences at which speed of chemical reaction of materials a part REE increases. It is represented the equation which has been received by the Swedish chemist Svante Arreniusom from thermodynamic reasons
The article considers the questions assessing the reliability of mechanical components used in the electronic equipment in the early stages of design. The calculations of failure rates springs shock absorbers according to various methods. It is shown that the use of models failure rates of mechanical elements, taking into account the peculiarities of their structural and technological performance, not only allows us to solve the problem of calculating, but also to ensure the required level of reliability and mechanical components, and containing electronic equipment.
The monograph contents totaled the many years results of Scientific school «The Automated System for Ensuring of Reliability and Quality of Equipment - ASONIKA» National research University «Higher school of Economics» (scientific supervisor of the Scientific school - academician of RANS, doctor of technical sciences, professor YU. Kofanov) and long-term cooperation with the scientists of Kiev Institute of mathematical machines and systems problems of the Ukrainian National Sciences Academy (Deputy Director on science, doctor of technical sciences V.P. Strelnikov). The final structure of the monograph had been formed in the discussion of modern problems of reliability aerospace electronic equipment at the XVII International scientific-technical conference «Systemic problems of reliability, quality, mathematical modelling, information and infocommunication technologies in innovation projects». This conference was dedicated to the 20th anniversary of the HSE. The book outlines the basics of probability-physical approach to the study and the assessment of the reliability of onboard aerospace equipment. Presents the methods of estimation of reliability parameters of electronic components, as according to reference data and test or operating results in the presence or absence of failures. Developed the methods of calculation of reliability parameters of mechanical elements of aerospace equipment as well as research methods reliability of redundant and non-redundant, non-renewable and renewable systems on the basis of adequate two-parameter distributions of diffusion. Established the theory of planning reliability test with lightweight, durable, including accelerated testing with new methods of processing the testing results and reliability assessment. We propose new methods of evaluation and prediction of the aerospace equipment reliability to measure the determining parameters. Developed methodology of the statistical characteristics evaluation of the degradation process for the study of single samples of aerospace equipment using information about its representative minobject (minibranch, mineralizatsiya). All problems of reliability, which is solved in this book (mathematical modeling, calculation and experimental evaluation of the reliability of systems) result in the identification of the time until failure (or to failure) distribution. It is proved that when assessing the reliability of onboard aerospace equipment, most accurate results diffusion DN-distribution. On the basis of the law of distribution can be carried out the evaluation of all the necessary parameters of aerospace equipment reliability (mathematical expectations developments, gamma-interest developments, the probability of non-failure operating time for the specified time, the residual resource and others). The book provides a large number of examples and problems, proving the effectiveness and efficiency of the proposed methods. Material monograph mostly taught HSE in the various courses of lectures. The monograph is intended for a wide circle of specialists working in the field design, testing and operation of onboard aerospace equipment, as well as students and graduate students of the HSE in the execution of their coursework, independent scientific research, and the preparation of graduation theses and dissertations.
Maintenance of reliability of radio-electronic equipment taking into account thermal modes for various classes of electroradioproducts (ERP) within the limits of system ASONIKA is considered.
Statistical Models and Methods for Reliability and Survival Analysis is a volume of contributions by specialists in statistical theory and their applications that provide up-to-date developments in methods used in survival analysis, statistical goodness of fit, stochastic processes for system reliability among others. Many of them are related to the work of Professor M. Nikulin in statistics for thirty years. The contributors accepted this challenging project to gather various contributions with a wide broad of techniques and results, all of them in the topics of the past S2MRSA conference dedicated to M. Nikulin for his twentieth anniversary as a Professor in the Bordeaux Segalen University. The book is intended for researchers interested in statistical methodology and models useful in survival analysis, system reliability and statistical testing for censored and non censored data.
The monograph presents results by professor Dr. A. Shalumov’s Research School of Modeling, Information Technology and Automated Systems (Russia). The program, ASONIKA, developed by the school is reviewed here regarding reliability and quality of devices for simulation of electronics and chips during harmonic and random vibration, single and multiple impacts, linear acceleration and acoustic noise, and steady-state and transient thermal effects. Calculations are done for thermal stress during changes in temperature and power in time. Calculations are done for number of cycles to fatigue failure under mechanical loads as well as under cyclic thermal effects. Simulation results for reliability analysis are taken into account. Models, software interface, and simulation examples are presented.
For engineers and scientists involved in design automation of electronics.
In this paper the comparative characteristics of the РС ASONIKA-K and PМ of reliability calculations are given.