Оценка долговечности СВЧ-транзисторов
We consider the evaluation of the durability of microwave transistors
The paper considers the use of alpha-distribution to analyze the influence of radiation on the reliability of command and measuring systems of the spacecraft. The financial support from the Government of the Russian Federation within the framework of the implementation of the 5-100 Programme Roadmap of the National Research University – Higher School of Economics is acknowledged.
This study (researchgrant No 15-05-0029) was supported by The National Research University–Higher School of Economics’
Academic FundProgramin 2015/2016.
Constant growth of spacecraft operating life requirements leads to creating equipment which fits these requirements. From this point of view, specifically durability prediction allows to evaluate the potential of creating equipment with a long operating life. On early stages of equipment’s development analytical methods of durability prediction are used. Obviously, the more precise the estimation is, the more likely that the practical test will confirm the durability predictions. Therefore, improving the engineering techniques of the durability prediction is a relevant problem.
The objective of this research is to improve the quality of design work by enhancing the engineering techniques of the durability prediction, which raise the authenticity of the evaluations.
Life of the equipment are calculated using the statistical modelling method (Monte-Carlo method). This method takes into consideration probabilistic characteristics of constituent elements’ life.
As a result, the problem of predicting operating life of electronic equipment using the reference data on early stages of development is solved. An analysis of standardized method of durability prediction was performed which revealed existing limitations for using this method when predicting operating life of electronic equipment. An alternate, statistical method of predicting operating life of electronic equipment was suggested and a software implementation was created. Developed software was tested and verified. Analytical experiments were performed to show the authenticity of the suggested method and to compare it to the standardized one.
Thus, results of the performed research show that the standardized method is applicable only for calculating the minimum operating time. Also, it was concluded that the truncation parameter of element’s life distribution, variation coefficient of life and some specific qualities of dependability prediction scheme have to be taken into consideration when predicting durability of electronic equipment.
The paper offers methodology for estimation of durability indices of the modern integrated circuit communication network, which has reports about the conducted tests on non-failure operations and conservability, but has no data for the durability. The paper describes two approaches, which apply for generation of basic data and which allow to receive reliable result, typical for the certain operating conditions.
The article deals with forecasting the dependability indicators of state-of-the-art spacecraft onboard equipment. The authors demonstrate the applicability of the results of equipment and components testing for resistance to ionizing radiation in forecasting dependability indicators. They prove the applicability of Alfa distribution of time to failure in forecasting CMOS IC reliability and longevity. The paper presents design ratios for probability evaluation of fail-safe operation, mean time to failure and minimum operation time. Ways are shown to improve the resistance of state-of-the-art spacecraft onboard equipment through the use of specialized means of protection against the effects of ionizing radiation of the outer space. This research (No. 14-05-0038) was conducted with the support of the Higher School of Economics Academic Fund Program in 2014.
The report considers the issues of forecasting the reliability parameters of modern on-board equipment of spacecrafts. The expediency of using the results of tests of equipment and it’s components for resistance to the effects of ionizing radiation to predict the reliability parameters. Substantiated the possibility of alpha-time distribution for the MTBF prediction of reliability and durability of the CMOS integrated circuit. Shown the calculated ratios for estimating the probability of failure-free operation, the mean time between failure and minimum service life. Given possible ways of increasing the life of modern on-board equipment of spacecrafts by using specialized methods of protection against ionizing radiation of space. This study (research grant No 14-05-0038) was supported by The National Research University - Higher School of Economics’ Academic Fund Program in 2014.
The article deals with the issue of reliability, namely the durability of computer engineering. The methodology of the refined estimation of durability indicators of computer engineering in the IDEF0-diagram format is developed. The example of usage of the developed methodology is given. The object of research the graphics card of the AMD Radeon type is chosen. A summary table of the mean group value of the variation coefficient for the subgroups of electrical components, which are part of the selected graphics card, is formed. A comparison of the numerical values of the gamma-percentile operating life of the graphics card, taking into account the different values of the coefficient of variation, was made. The influence of the coefficient of variation on the value of gamma-percentile operating life is considered. The methodology allows obtaining more accurate values of durability indicators and thereby increasing the reliability of the calculated assessment of durability characteristics.