Лабораторный практикум по устройствам на операционных усилителях для лабораторного стенда NI ELVIS
The project of laboratory practical works for studying of different electronic devices based on microcircuits of operational amplifiers was developed.
Three methods of operational amplifier (Op amp) slew rate verification are considered. These methods are illustrated through the example of SPICE macro models of Op amp LMH6642 by Texas Instruments and ОР37 by Analog Devices.
AMT 2013 is the most comprehensive conference focused on the various aspects of advances in Advanced Measurement and Test. The conference provides a chance for academic and industry professionals to discuss recent progress in the area of Advanced Measurement and Test. The goal of AMT2013 is to bring together the researchers from academia and industry as well as practitioners to share ideas, problems and solutions relating to the multifaceted aspects of Advanced Measurement and Test.
In article relevance of application of computer modeling on the example of subsystems of ASONIKA-T, ASONIKA-M-3D and ASONIKA-TM of the ASONIKA software product for the analysis of standard and nonstandard designs of radio-electronic funds for influence of thermal and mechanical factors is considered. Possibilities of these subsystems are described. The technique of preparation of model to calculation on mechanical influences in ASONIKA-M-3D subsystem is presented. Modeling examples are given.
In article the features of the vibration loads reviewed acting on the radio-electronic means. Also analyzed the method of mathematical modeling of vibration and associated dissipation of mechanical energy. Authors conducted a computational experiment to simulate the dissipation of mechanical energy in the printed circuit assembly and gave a general evaluation of its results.
The monograph presents results by professor Dr. A. Shalumov’s Research School of Modeling, Information Technology and Automated Systems (Russia). The program, ASONIKA, developed by the school is reviewed here regarding reliability and quality of devices for simulation of electronics and chips during harmonic and random vibration, single and multiple impacts, linear acceleration and acoustic noise, and steady-state and transient thermal effects. Calculations are done for thermal stress during changes in temperature and power in time. Calculations are done for number of cycles to fatigue failure under mechanical loads as well as under cyclic thermal effects. Simulation results for reliability analysis are taken into account. Models, software interface, and simulation examples are presented.
For engineers and scientists involved in design automation of electronics.
Based on the above-described method of the electronic structures synthesis, an automated subsystem ASONIKA-V has been developed. This subsystem is designed to analyze the mechanical characteristics and synthesis of cabinets structures, racks and blocks electronics, mounted on vibration isolators, under the influence of harmonic vibration, random vibration, shock loads, linear acceleration, under the influence of acoustic noise, as well as complex mechanical influences and decision-making on the basis of the mechanical characteristics in order to ensure structures stability of electronic to mechanical stress.
The International Conference founded by the prominent scientist Professor V.P.Sigorsky will be held on April 18-20, 2017 at National Technical University of Ukraine "Kyiv Polytechnic Institute".
The wellknown professionals as well as post-graduate students from Ukraine, Russia, Armenia, Germany, South Korea, Mexico, USA traditionally participate in the conference.