Виброзащита объектов микроэлектроники в контрольно-диагностическом и технологическом оборудовании
The questions of protecting from the vibrations objects are considered in control-diagnostic and technological equipment. Offered four level system of defence of objects of microelectronics from vibrations. For each of levels of the system the technological decisions of protecting from the vibrations devices are presented
The article treats of one of the current trends of microelectronics, which can be a basis for creation of elective courses or project studies of the students. The article gives the basic theoretical principles and practical applications
The CLAS12 experiment is intended to study the generalized parton distributions in exclusive reactions. The CLAS12 Silicon Vertex Tracker must provide the registration of all reaction products at the expected high luminosity. The results of a GEANT4 simulation of the expected physical rates in the SVT are presented. The frequency of the noise hits of the readout electronics is determined on the basis of the capacitive load generated by the attached sensors. In order to find the fraction of the events that are lost due to delays in the readout electronics, a computer simulation of the logic of the data-driven readout FSSR2 chip is performed. At a signal-to-noise ratio of 8 to 1 the readout electronics are capable of processing the expected rates, provided a registration threshold of 0.4 mip is preset.
The article discusses current issues related to the development and application of virtual simulation to ensure the reliability of the electronic equipment in the presence of vibrations on the on-board equipment of the object of its installation. The authors constructed an algorithm of the method of ensuring vibration reliability of developed structures of electronic equipment in the process of virtual simulation with receiving the vibration fields on the structures and mechanical loads on each electronic component.
Generalized error-locating codes are discussed. An algorithm for calculation of the upper bound of the probability of erroneous decoding for known code parameters and the input error probability is given. Based on this algorithm, an algorithm for selection of the code parameters for a specified design and input and output error probabilities is constructed. The lower bound of the probability of erroneous decoding is given. Examples of the dependence of the probability of erroneous decoding on the input error probability are given and the behavior of the obtained curves is explained.
The dynamics of a two-component Davydov-Scott (DS) soliton with a small mismatch of the initial location or velocity of the high-frequency (HF) component was investigated within the framework of the Zakharov-type system of two coupled equations for the HF and low-frequency (LF) fields. In this system, the HF field is described by the linear Schrödinger equation with the potential generated by the LF component varying in time and space. The LF component in this system is described by the Korteweg-de Vries equation with a term of quadratic influence of the HF field on the LF field. The frequency of the DS soliton`s component oscillation was found analytically using the balance equation. The perturbed DS soliton was shown to be stable. The analytical results were confirmed by numerical simulations.
Radiation conditions are described for various space regions, radiation-induced effects in spacecraft materials and equipment components are considered and information on theoretical, computational, and experimental methods for studying radiation effects are presented. The peculiarities of radiation effects on nanostructures and some problems related to modeling and radiation testing of such structures are considered.
This volume presents new results in the study and optimization of information transmission models in telecommunication networks using different approaches, mainly based on theiries of queueing systems and queueing networks .
The paper provides a number of proposed draft operational guidelines for technology measurement and includes a number of tentative technology definitions to be used for statistical purposes, principles for identification and classification of potentially growing technology areas, suggestions on the survey strategies and indicators. These are the key components of an internationally harmonized framework for collecting and interpreting technology data that would need to be further developed through a broader consultation process. A summary of definitions of technology already available in OECD manuals and the stocktaking results are provided in the Annex section.