Построение тестов цифровых схем с использованием обобщенной модели неисправностей и непрерывного подхода к моделированию
This paper considers the development of digital circuit tests using continuous models of discrete devices. An algorithm is presented which makes it possible to solve the problem of finding test sets using continuous optimization. A generalized fault model is proposed which implements a unified approach to the representation of different types of faults in test generation. The proposed approach is implemented as a software environment for research and development of fault models and algorithms for finding digital circuit tests. For testing, a system of automated test generation for constant faults of combinational circuits has been built. The performance estimation results for the software package developed for the ISCAS '85 benchmark circuits demonstrate the effectiveness of the algorithms and methods used.