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Article

Разработка методики выявления факторов, наиболее сильно влияющих на надежность электронных устройств

Полесский С. Н., Алейников А. В., Маякова О. Ю.

Purpose. In order to determine the level of the reliability of electronic device it is necessary to develop method for analyzing the results of calculation its reliability measures. Such measures are reliability function and mean operating time between failures. Developed method will allow estimating which parameter most strongly effects on the final value of the failure rate for the particular type of the electronic equipment. As a result of the reliability analysis of all the components of electronic device an engineer should obtain values of the reliability measures, boundary values of the operated parameters, and also the recommendations about this or another changes needed for the improvement of the reliability of the electronic device. The aim of the paper is to develop the method for analyzing the results of the reliability measures calculation. All known methods estimate the effect of the parameters by comparing values of the correction factors. New method will allow to analyze calculated values of the factors and to determine the effect of each individual parameter for each correction factor using the relative sensitivity function. The second statement is the main benefit of this study. The parameters considered in the analysis can include, for example, temperature, nominals of the elements, their operating voltage, current and power and tolerance value. Results. The application of the developed method will allow making precise recommendations for changes of the operated parameters. This, in its turn, will help to control the reliability level of one or another element and, consequently, of whole electronic devices.