Автоматизированный измерительный комплекс для параметрического контроля трансформаторов
The article discusses questions of construction of the automated measuring complex intended for parametric control of voltage and current transformers. An example of determining the optimal structure of such complex by the method of hierarchy analysis is given. Calculations of measurements errors of the parameters of transformers for this complex are made.
The paper describes the features of an automated system for measurement and processing of electrical characteristics of BJTs and MOS transistors in the presence of thermal and radiation effects. Automation is made possible with employing of long measurement cables and a ramified scripting system. The system is based on a set of measuring instruments, methods of measurements and processing of results for transistors of various types. Shown are the examples of the system usage for studying BJTs and MOSFETs, determining the SPICE-model parameters.
Measurement technique is proposed that makes it possible to control the resistance of a large number of low-resistance objects taking into account the resistance of lead wires and switching elements. An example of the implementation of the proposed method with the data acquisition/switching system HP34970A is given.
The theory of contrasting structures in singularly perturbed boundary problems for nonlinear parabolic partial differential equations is applied to the research of formation of steady state distributions of power within the nonlinear of "Power-Society" model. The interpretation of the solutions to the equation are presented in terms of applied model. The possibility theorem for the problem of getting the solution having some preassigned properties by means of parametric control is proved.
The paper presents an example of creation of the automated measuring complex, designed to control the parameters of transformers. An example of determining the structure of the automated measuring complex with method of analysis of hierarchies.
Hardware-software system designed for automated SOI MOSFETs characteristics measurement, processing and SPICE model parameter extraction taking into account high temperature (HT) effects (to 300°C) is presented. The essence of the system is comprised of a set of selected measurement instru-ments, measurement and data processing methods with the pur-pose of SPICE model library creation in lightly manned condi-tions. This capability to program measurement conditions and data collection, processing and saving is realized with in-house LabVIEW virtual instruments.
Generalized error-locating codes are discussed. An algorithm for calculation of the upper bound of the probability of erroneous decoding for known code parameters and the input error probability is given. Based on this algorithm, an algorithm for selection of the code parameters for a specified design and input and output error probabilities is constructed. The lower bound of the probability of erroneous decoding is given. Examples of the dependence of the probability of erroneous decoding on the input error probability are given and the behavior of the obtained curves is explained.
The dynamics of a two-component Davydov-Scott (DS) soliton with a small mismatch of the initial location or velocity of the high-frequency (HF) component was investigated within the framework of the Zakharov-type system of two coupled equations for the HF and low-frequency (LF) fields. In this system, the HF field is described by the linear Schrödinger equation with the potential generated by the LF component varying in time and space. The LF component in this system is described by the Korteweg-de Vries equation with a term of quadratic influence of the HF field on the LF field. The frequency of the DS soliton`s component oscillation was found analytically using the balance equation. The perturbed DS soliton was shown to be stable. The analytical results were confirmed by numerical simulations.
Radiation conditions are described for various space regions, radiation-induced effects in spacecraft materials and equipment components are considered and information on theoretical, computational, and experimental methods for studying radiation effects are presented. The peculiarities of radiation effects on nanostructures and some problems related to modeling and radiation testing of such structures are considered.
This volume presents new results in the study and optimization of information transmission models in telecommunication networks using different approaches, mainly based on theiries of queueing systems and queueing networks .
The paper provides a number of proposed draft operational guidelines for technology measurement and includes a number of tentative technology definitions to be used for statistical purposes, principles for identification and classification of potentially growing technology areas, suggestions on the survey strategies and indicators. These are the key components of an internationally harmonized framework for collecting and interpreting technology data that would need to be further developed through a broader consultation process. A summary of definitions of technology already available in OECD manuals and the stocktaking results are provided in the Annex section.