The methodology and software tools for multi-level thermal and electro-thermal design of electronic components are presented. The discussion covers 2D/3D constructions of: 1) discrete and integrated semiconductor devices; 2) monolithic and hybrid ICs and VLSIs; 3) Hybrid ICs, MCMs and PCBs. The actual test validation through IR thermal measurement is demonstrated for all types of components.
The urgency of test generation problem is founded to increase the efficiency of monitoring and diagnosing electronic means. As part of the information system of diagnostic modeling implementation, the algorithm of test forming, that provides analysis of the circuitry in the static mode, as well as in the frequency and time domains, is considered. In the static mode operation is considered to explore the «input/output» characteristic, where there are different testing algorithms for linear and nonlinear plots. In frequency domain, according to the algorithm of test forming, the zeros and poles of transfer function are calculated. After that the most effective frequencies of test signals are chosen between zeros and poles. In dynamic domain, according to the appropriate algorithm, the operation form and operation characteristic of circuitry are chosen. Then permissible parameters of electronic components are analyzed. The selection method of effective test impact is proposed according to the uniqueness criterion of distinguishing detectable defects. The diagnostic modeling is carried out, wherein the output characteristics at the circuit output or at internal nodes are analyzed under the test impact and to the degree of defects differentiation within measurement error is determined.
The paper substantiates the necessity and development of original mathematical model of zener, which allows to carry out diagnostic modeling of radio-electronic means in wide range of faultiness. Proposed model can be included in composition of base of mathematical models of complete units of modern computer programs of schematic analysis.
The paper discusses the basic operations to ensure testability of electronic means (EM). The result of the proposed transactions is the basis of the diagnostic data. To improve the efficiency of the diagnostic modeling of the underlying testability design, the processes of calculation of tolerance limits and creation a list of possible defects are considered. Allocated a distinguishing feature of the proposed method, which consists in taking into account the thermal characteristics for electrical diagnostic modeling. The technique of checking the uniqueness of detection considered defects. And a criterion for evaluation of the achieved level of testability is also proposed