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Proceedings of 27-th IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, USA, March 2011

The 2011 Semiconductor Thermal Measurement and Management (SEMI-THERM) Symposium is an annual international forum for the presentation of new developments in and applications relating to generation and removal of heat within semiconductor devices and measurement of junction temperatures under various applications and environmental conditions. The forum of this Symposium this year couples nine sections of selected technical papers. The Symposium is preceded with four Short Courses: “Thermal Challenges in 3D Packaging”, “Transient Tth-JC Measurement and Compact Thermal Model Generation”, “Thermal Reliability Issues in Modern Electronics Systems”, “Thermal Management of Electronics”. In addition, an exhibits area offers displays of equipment, software and other resources within the thermal measurements field.

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Proceedings of 27-th IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, USA, March 2011