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Влияние электростатических разрядов на показатели ремонтопригодности электронных средств
Технологии электромагнитной совместимости. 2015. № 4. С. 29-34.
Indicators of maintainability of modern electronic devices greatly depend on the characteristics of reliability of electronic components. The impact of catastrophic electrical overstress due to electrostatic discharge can lead to failures of integrated circuits, which are widely used in electronic tools. The article considers the issues of assessing the impact of electrostatic discharges on the performance of maintainability of electronic means.
Research target:
Electronics and Electrical Engineering
Priority areas:
engineering science
Language:
Russian
Keywords: интенсивность отказовэлектростатический разрядэлектронное средствоИнтегральная схемаelectrostatic dischargefailure rateelectronic meansремонтопригодностьmicrocircuitsmaintainability
Publication based on the results of:
Abrameshin A. E., Zhadnov V. V., Технологии электромагнитной совместимости 2014 № 2 С. 27-34
Indicators of non-failure operation of the onboard space equipment substantially depend on characteristics of reliability microcircuits. One of possible causes of failures microcircuits is influence of catastrophic electrical overstress owing to electrostatic discharges. In article the method of formation of mathematical model of failure rate microcircuits and possibility of its application for microcircuits for the ...
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Агапов В. В., Технологии электромагнитной совместимости 2009 № 2 С. 72-75
Electrostatic Discharges, Interferences, Cables, Spacecraft, Onboard Electronics. This paper presents an original test equipment of the electrostatic discharge interferences in a spacecraft cables. Received current transformation into disturb voltage coefficients in the cable sections are used in calculation of interference levels at inputs of a spacecraft onboard radio-electronic equipment. ...
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Dependability of power electronics products designed for power supply of electronic equipment, largely determine its dependability, because failure of the power supply system, as a rule, leads to failure of the equipment as a whole. Therefore, the secondary power supply must be highly reliable. To ensure the required dependability of power supplies, various methods of ...
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Kuznetsov V., Kechiev L., IEEE Transactions on Electromagnetic Compatibility 2015 Vol. 57 No. 5 P. 947-954
In this paper, power MOS transistor behavior under charged board model (CBM) ESD impact is considered. The analysis of the MOSFET failure condition at the CBM ESD event is performed. The CBM equivalent circuit is proposed. The physical parameters of the PCB and device under test are replaced by the lumped RCL circuit. The MOSFET ...
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М. : МИЭМ, 2004
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Zhadnov V. V., Екатеринбург : ООО «Форт Диалог-Исеть», 2014
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В работе рассмотрены подходы к построению вычислительной схемы ускоренного метода расчета наводок в бортовой кабельной сети космических аппаратов. Показано, что в случае больших эквивалентных электрических схем космических аппаратов для построения вычислительной схемы необходимо решать систему линейных алгебраических уравнений с разреженной блочной матрицей высокого порядка. Учитывая данную специфику, было предложено преобразовать эту матрицу к треугольному виду ...
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Novikov L., Хасаншин Р. Х., Гаценко Л. С. et al., Перспективные материалы 2015 № 1 С. 22-29
A comparative analysis of electrostatic discharges on surfaces of К-208 and CMG glasses under irradiation by 10- to 40-keV electrons with flux densities from 1010 to 2,5×1011 cm-2s-1 in vacuum was done. The discharges accompanied by plasma ejections into surrounding and formation of microprotrusions and discharge channels were observed on the both glasses. However, the ...
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Artyukhova M. A., Zhadnov V. V., Polesskiy S., Компоненты и технологии 2014 № 4(153) С. 204-207
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